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Some Concerns on the Measurement for Biometric Analysis and Applications

Patrick S. P. Wang. Some Concerns on the Measurement for Biometric Analysis and Applications. In Svetlana N. Yanushkevich, Marina L. Gavrilova, Patrick S. P. Wang, Sargur N. Srihari, editors, Image Pattern Recognition - Synthesis and Analysis in Biometrics. Volume 67 of Series in Machine Perception and Artificial Intelligence, pages 321-338, WorldScientific, 2007. [doi]

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Patrick S. P. Wang

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