Chih-Hsuan Wang. Separation of composite defect patterns on wafer bin map using support vector clustering. Expert Syst. Appl., 36(2):2554-2561, 2009. [doi]
@article{Wang09f-1,
title = {Separation of composite defect patterns on wafer bin map using support vector clustering},
author = {Chih-Hsuan Wang},
year = {2009},
doi = {10.1016/j.eswa.2008.01.057},
url = {http://dx.doi.org/10.1016/j.eswa.2008.01.057},
researchr = {https://researchr.org/publication/Wang09f-1},
cites = {0},
citedby = {0},
journal = {Expert Syst. Appl.},
volume = {36},
number = {2},
pages = {2554-2561},
}