Fu-Kwun Wang. Measuring the Process Yield for Simple Linear Profiles with one-Sided Specification. Quality and Reliability Eng. Int., 30(8):1145-1151, 2014. [doi]
@article{Wang14-100,
title = {Measuring the Process Yield for Simple Linear Profiles with one-Sided Specification},
author = {Fu-Kwun Wang},
year = {2014},
doi = {10.1002/qre.1537},
url = {http://dx.doi.org/10.1002/qre.1537},
researchr = {https://researchr.org/publication/Wang14-100},
cites = {0},
citedby = {0},
journal = {Quality and Reliability Eng. Int.},
volume = {30},
number = {8},
pages = {1145-1151},
}