Fu-Kwun Wang. Process Yield Analysis for Nonlinear Profiles in the Presence of Gauge Measurement Errors. Quality and Reliability Eng. Int., 32(7):2435-2442, 2016. [doi]
@article{Wang16e,
title = {Process Yield Analysis for Nonlinear Profiles in the Presence of Gauge Measurement Errors},
author = {Fu-Kwun Wang},
year = {2016},
doi = {10.1002/qre.1946},
url = {http://dx.doi.org/10.1002/qre.1946},
researchr = {https://researchr.org/publication/Wang16e},
cites = {0},
citedby = {0},
journal = {Quality and Reliability Eng. Int.},
volume = {32},
number = {7},
pages = {2435-2442},
}