Thermal-aware lifetime reliability in multicore systems

Shengquan Wang, Jian-Jia Chen. Thermal-aware lifetime reliability in multicore systems. In 11th International Symposium on Quality of Electronic Design (ISQED 2010), 22-24 March 2010, San Jose, CA, USA. pages 399-405, IEEE, 2010. [doi]

Authors

Shengquan Wang

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Jian-Jia Chen

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