A Seed-Selection Method to Increase Defect Coverage for LFSR-Reseeding-Based Test Compression - researchr publication authors

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Zhanglei Wang, Krishnendu Chakrabarty, Michael Bienek. A Seed-Selection Method to Increase Defect Coverage for LFSR-Reseeding-Based Test Compression. In 12th European Test Symposium (ETS 2007), 20 May 2007, Freiburg, Germany. pages 125-130, IEEE Computer Society, 2007. [doi]

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