Chao Wang, Qingqing Cao, Ziqiang Cui, Yuxiang Chen, Huaxiang Wang. Evaluation of Voltage-driven Electrical Resistance Tomography Using LCR Meter-based Measurement System. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2019, Auckland, New Zealand, May 20-23, 2019. pages 1-6, IEEE, 2019. [doi]
@inproceedings{WangCCCW19,
title = {Evaluation of Voltage-driven Electrical Resistance Tomography Using LCR Meter-based Measurement System},
author = {Chao Wang and Qingqing Cao and Ziqiang Cui and Yuxiang Chen and Huaxiang Wang},
year = {2019},
doi = {10.1109/I2MTC.2019.8827082},
url = {https://doi.org/10.1109/I2MTC.2019.8827082},
researchr = {https://researchr.org/publication/WangCCCW19},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2019, Auckland, New Zealand, May 20-23, 2019},
publisher = {IEEE},
isbn = {978-1-5386-3460-8},
}