Test set enrichment using a probabilistic fault model and the theory of output deviations

Zhanglei Wang, Krishnendu Chakrabarty, Michael Gössel. Test set enrichment using a probabilistic fault model and the theory of output deviations. In Georges G. E. Gielen, editor, Proceedings of the Conference on Design, Automation and Test in Europe, DATE 2006, Munich, Germany, March 6-10, 2006. pages 1270-1275, European Design and Automation Association, Leuven, Belgium, 2006. [doi]

@inproceedings{WangCG06:2,
  title = {Test set enrichment using a probabilistic fault model and the theory of output deviations},
  author = {Zhanglei Wang and Krishnendu Chakrabarty and Michael Gössel},
  year = {2006},
  doi = {10.1145/1131832},
  url = {http://doi.acm.org/10.1145/1131832},
  tags = {testing},
  researchr = {https://researchr.org/publication/WangCG06%3A2},
  cites = {0},
  citedby = {0},
  pages = {1270-1275},
  booktitle = {Proceedings of the Conference on Design, Automation and Test in Europe, DATE 2006, Munich, Germany,  March 6-10, 2006},
  editor = {Georges G. E. Gielen},
  publisher = {European Design and Automation Association, Leuven, Belgium},
  isbn = {3-9810801-0-6},
}