Sying-Jyan Wang, Ting-Jui Choi, Katherine Shu-Min Li. Side-Channel Attack on Flipped Scan Chains. In 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016. pages 67-72, IEEE Computer Society, 2016. [doi]
@inproceedings{WangCL16-12, title = {Side-Channel Attack on Flipped Scan Chains}, author = {Sying-Jyan Wang and Ting-Jui Choi and Katherine Shu-Min Li}, year = {2016}, doi = {10.1109/ATS.2016.43}, url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2016.43}, researchr = {https://researchr.org/publication/WangCL16-12}, cites = {0}, citedby = {0}, pages = {67-72}, booktitle = {25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016}, publisher = {IEEE Computer Society}, isbn = {978-1-5090-3809-1}, }