Using Pat2Vec Model to Discover the Technology Structure

Xiaomei Wang, Ting Chen, Guopeng Li. Using Pat2Vec Model to Discover the Technology Structure. In Giuseppe Catalano, Cinzia Daraio, Martina Gregori, Henk F. Moed, Giancarlo Ruocco, editors, Proceedings of ISSI 2019 Rome: 17th International Society of Scientometrics and Informetrics Conference, Rome, Italy, 2-5 September, 2019, Rome, Italy, September 2-5, 2019. pages 1570-1575, Edizioni Efesto, 2019.

@inproceedings{WangCL19-10,
  title = {Using Pat2Vec Model to Discover the Technology Structure},
  author = {Xiaomei Wang and Ting Chen and Guopeng Li},
  year = {2019},
  researchr = {https://researchr.org/publication/WangCL19-10},
  cites = {0},
  citedby = {0},
  pages = {1570-1575},
  booktitle = {Proceedings of ISSI 2019 Rome: 17th International Society of Scientometrics and Informetrics Conference, Rome, Italy, 2-5 September, 2019, Rome, Italy, September 2-5, 2019},
  editor = {Giuseppe Catalano and Cinzia Daraio and Martina Gregori and Henk F. Moed and Giancarlo Ruocco},
  publisher = {Edizioni Efesto},
  isbn = {978-88-3381-118-5},
}