ADDLL/VDD-biasing co-design for process characterization, performance calibration, and clock synchronization in variation-tolerant designs - researchr publication authors

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Jinn-Shyan Wang, Yung-Chen Chien, Jia-Hong Lin, Chun-Yuan Cheng, Ying-Ting Ma, Chung-Hsun Huang. ADDLL/VDD-biasing co-design for process characterization, performance calibration, and clock synchronization in variation-tolerant designs. In 2011 IEEE 9th International Conference on ASIC, ASICON 2011, Xiamen, China, October 25-28, 2011. pages 47-50, IEEE, 2011. [doi]

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