Jen-Ya Wang, Fuh-Gwo Chen, David Wen-Shung Tai, Jr-Shian Chen. An Automatic Test Generator for Enhancing the Technolgy Profciency of Senior High School Students. In 5th IIAI International Congress on Advanced Applied Informatics, IIAI-AAI 2016, Kumamoto, Japan, July 10-14, 2016. pages 273-276, IEEE, 2016. [doi]
@inproceedings{WangCTC16,
title = {An Automatic Test Generator for Enhancing the Technolgy Profciency of Senior High School Students},
author = {Jen-Ya Wang and Fuh-Gwo Chen and David Wen-Shung Tai and Jr-Shian Chen},
year = {2016},
doi = {10.1109/IIAI-AAI.2016.69},
url = {http://doi.ieeecomputersociety.org/10.1109/IIAI-AAI.2016.69},
researchr = {https://researchr.org/publication/WangCTC16},
cites = {0},
citedby = {0},
pages = {273-276},
booktitle = {5th IIAI International Congress on Advanced Applied Informatics, IIAI-AAI 2016, Kumamoto, Japan, July 10-14, 2016},
publisher = {IEEE},
isbn = {978-1-4673-8985-3},
}