Simulation of near-tip crack behaviour and its correlation to fatigue crack growth with a modified strip-yield model

Lei Wang, Yongkang Chen, William Tiu, Yigeng Xu. Simulation of near-tip crack behaviour and its correlation to fatigue crack growth with a modified strip-yield model. IJMIC, 5(1):77-91, 2008. [doi]

Authors

Lei Wang

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Yongkang Chen

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William Tiu

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Yigeng Xu

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