Zirong Wang, Zhen Chen, Tangbin Xia, Ershun Pan. Degradation Modeling Considering the Dependency of Rate and Volatility for Real-Time Prognostics With Error Correction. IEEE T. Instrumentation and Measurement, 73:1-12, 2024. [doi]
@article{WangCXP24,
title = {Degradation Modeling Considering the Dependency of Rate and Volatility for Real-Time Prognostics With Error Correction},
author = {Zirong Wang and Zhen Chen and Tangbin Xia and Ershun Pan},
year = {2024},
doi = {10.1109/TIM.2023.3346507},
url = {https://doi.org/10.1109/TIM.2023.3346507},
researchr = {https://researchr.org/publication/WangCXP24},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {73},
pages = {1-12},
}