Xin Wang, Jun Chen, Jianxin Zhao, Yecheng Wang, Xinhao Sun, Yi Quan, Zhaoxi Li, Chunlong Fei, Yintang Yang. Ultrahigh-Frequency Piezoelectric Thin Film for Determination of Silicon Attenuation Coefficient. IEEE T. Instrumentation and Measurement, 74:1-8, 2025. [doi]
@article{WangCZWSQLFY25,
title = {Ultrahigh-Frequency Piezoelectric Thin Film for Determination of Silicon Attenuation Coefficient},
author = {Xin Wang and Jun Chen and Jianxin Zhao and Yecheng Wang and Xinhao Sun and Yi Quan and Zhaoxi Li and Chunlong Fei and Yintang Yang},
year = {2025},
doi = {10.1109/TIM.2025.3556914},
url = {https://doi.org/10.1109/TIM.2025.3556914},
researchr = {https://researchr.org/publication/WangCZWSQLFY25},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {74},
pages = {1-8},
}