A novel method of eliminating the background in Fourier transform profilometry based on Bi-dimensional Empirical Mode Decomposition - researchr publication authors

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Chenxing Wang, Feipeng Da. A novel method of eliminating the background in Fourier transform profilometry based on Bi-dimensional Empirical Mode Decomposition. In First Asian Conference on Pattern Recognition, ACPR 2011, Beijing, China, 28-28 November, 2011. pages 340-344, IEEE, 2011. [doi]

This author has not been identified. Look up 'Chenxing Wang' in GoogleThis author has not been identified. Look up 'Feipeng Da' in Google

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