Changting Wang, Robert X. Gao. Wavelet transform with spectral post-processing for enhanced feature extraction [machine condition monitoring]. IEEE T. Instrumentation and Measurement, 52(4):1296-1301, 2003. [doi]
@article{WangG03-0,
title = {Wavelet transform with spectral post-processing for enhanced feature extraction [machine condition monitoring]},
author = {Changting Wang and Robert X. Gao},
year = {2003},
doi = {10.1109/TIM.2003.816807},
url = {http://dx.doi.org/10.1109/TIM.2003.816807},
tags = {process monitoring},
researchr = {https://researchr.org/publication/WangG03-0},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {52},
number = {4},
pages = {1296-1301},
}