Seongmoon Wang, Sandeep K. Gupta. ATPG for Heat Dissipation Minimization During Test Application. IEEE Transactions on Computers, 47(2):256-262, 1998.
@article{WangG98:3,
title = {ATPG for Heat Dissipation Minimization During Test Application},
author = {Seongmoon Wang and Sandeep K. Gupta},
year = {1998},
tags = {testing},
researchr = {https://researchr.org/publication/WangG98%3A3},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Computers},
volume = {47},
number = {2},
pages = {256-262},
}