Symbolic Nodal Analysis of Circuits Using Pathological Elements

Hung-Yu Wang, Wen-Chung Huang, Nan-Hui Chiang. Symbolic Nodal Analysis of Circuits Using Pathological Elements. IEEE Trans. on Circuits and Systems, 57-II(11):874-877, 2010. [doi]

@article{WangHC10-5,
  title = {Symbolic Nodal Analysis of Circuits Using Pathological Elements},
  author = {Hung-Yu Wang and Wen-Chung Huang and Nan-Hui Chiang},
  year = {2010},
  doi = {10.1109/TCSII.2010.2082930},
  url = {http://dx.doi.org/10.1109/TCSII.2010.2082930},
  researchr = {https://researchr.org/publication/WangHC10-5},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. on Circuits and Systems},
  volume = {57-II},
  number = {11},
  pages = {874-877},
}