Yutao Wang, Neil T. Heffernan, Cristina Heffernan. Towards better affect detectors: effect of missing skills, class features and common wrong answers. In Josh Baron, Grace Lynch, Nicole Maziarz, Paulo Blikstein, Agathe Merceron, George Siemens, editors, Proceedings of the Fifth International Conference on Learning Analytics And Knowledge, LAK '15, Poughkeepsie, NY, USA, March 16-20, 2015. pages 31-35, ACM, 2015. [doi]
@inproceedings{WangHH15,
title = {Towards better affect detectors: effect of missing skills, class features and common wrong answers},
author = {Yutao Wang and Neil T. Heffernan and Cristina Heffernan},
year = {2015},
doi = {10.1145/2723576.2723618},
url = {http://doi.acm.org/10.1145/2723576.2723618},
researchr = {https://researchr.org/publication/WangHH15},
cites = {0},
citedby = {0},
pages = {31-35},
booktitle = {Proceedings of the Fifth International Conference on Learning Analytics And Knowledge, LAK '15, Poughkeepsie, NY, USA, March 16-20, 2015},
editor = {Josh Baron and Grace Lynch and Nicole Maziarz and Paulo Blikstein and Agathe Merceron and George Siemens},
publisher = {ACM},
isbn = {978-1-4503-3417-4},
}