Wen Wang, Guoyong Han, Guanglei Sun. Fractal Anti-Counterfeit Label Comparison Using Combined Image Features and Clustering. IEEE Access, 8:134303-134310, 2020. [doi]
@article{WangHS20,
title = {Fractal Anti-Counterfeit Label Comparison Using Combined Image Features and Clustering},
author = {Wen Wang and Guoyong Han and Guanglei Sun},
year = {2020},
doi = {10.1109/ACCESS.2020.3011454},
url = {https://doi.org/10.1109/ACCESS.2020.3011454},
researchr = {https://researchr.org/publication/WangHS20},
cites = {0},
citedby = {0},
journal = {IEEE Access},
volume = {8},
pages = {134303-134310},
}