Zhen Wang, Mark G. Karpovsky. Robust FSMs for cryptographic devices resilient to strong fault injection attacks. In 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece. pages 240-245, IEEE, 2010. [doi]
@inproceedings{WangK10-11,
title = {Robust FSMs for cryptographic devices resilient to strong fault injection attacks},
author = {Zhen Wang and Mark G. Karpovsky},
year = {2010},
doi = {10.1109/IOLTS.2010.5560195},
url = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2010.5560195},
tags = {injection attack},
researchr = {https://researchr.org/publication/WangK10-11},
cites = {0},
citedby = {0},
pages = {240-245},
booktitle = {16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece},
publisher = {IEEE},
isbn = {978-1-4244-7724-1},
}