Yun-feng Wang, Jason I. Kilpatrick, Suzanne P. Jarvis, Frank Boland, Anil C. Kokaram, David Corrigan. Automated registration of low and high resolution atomic force microscopy images using scale invariant features. In 2014 IEEE International Conference on Image Processing, ICIP 2014, Paris, France, October 27-30, 2014. pages 5866-5870, IEEE, 2014. [doi]
@inproceedings{WangKJBKC14,
title = {Automated registration of low and high resolution atomic force microscopy images using scale invariant features},
author = {Yun-feng Wang and Jason I. Kilpatrick and Suzanne P. Jarvis and Frank Boland and Anil C. Kokaram and David Corrigan},
year = {2014},
doi = {10.1109/ICIP.2014.7026185},
url = {http://dx.doi.org/10.1109/ICIP.2014.7026185},
researchr = {https://researchr.org/publication/WangKJBKC14},
cites = {0},
citedby = {0},
pages = {5866-5870},
booktitle = {2014 IEEE International Conference on Image Processing, ICIP 2014, Paris, France, October 27-30, 2014},
publisher = {IEEE},
isbn = {978-1-4799-5751-4},
}