Exploring technological trends for patent evaluation

Shuting Wang, Wang-Chien Lee, Zhen Lei, Xianliang Zhang, Yu-Hsuan Kuo. Exploring technological trends for patent evaluation. In International Conference on Data Science and Advanced Analytics, DSAA 2014, Shanghai, China, October 30 - November 1, 2014. pages 277-283, IEEE, 2014. [doi]

@inproceedings{WangLLZK14,
  title = {Exploring technological trends for patent evaluation},
  author = {Shuting Wang and Wang-Chien Lee and Zhen Lei and Xianliang Zhang and Yu-Hsuan Kuo},
  year = {2014},
  doi = {10.1109/DSAA.2014.7058085},
  url = {http://dx.doi.org/10.1109/DSAA.2014.7058085},
  researchr = {https://researchr.org/publication/WangLLZK14},
  cites = {0},
  citedby = {0},
  pages = {277-283},
  booktitle = {International Conference on Data Science and Advanced Analytics, DSAA 2014, Shanghai, China, October 30 - November 1, 2014},
  publisher = {IEEE},
  isbn = {978-1-4799-6991-3},
}