On the Combined Impact of Soft and Medium Gate Oxide Breakdown and Process Variability on the Parametric Figures of SRAM components - researchr publication authors

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Hua Wang, Miguel Miranda, Francky Catthoor, Wim Dehaene. On the Combined Impact of Soft and Medium Gate Oxide Breakdown and Process Variability on the Parametric Figures of SRAM components. In 14th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2006), 2-4 August 2006, Taipei, Taiwan. pages 71-76, IEEE Computer Society, 2006. [doi]

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Hua Wang

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Francky Catthoor

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