Diagnosis of soybean bacterial blight progress stage based on deep learning in the context of data-deficient

Xueying Wang, Tong Pan, Jinqiu Qu, Yongzhe Sun, Linxiao Miao, Ziming Zhao 0011, Yang Li, Zhanguo Zhang, Hongjie Zhao, Zhenbang Hu, Dawei Xin, Qingshan Chen, Rongsheng Zhu. Diagnosis of soybean bacterial blight progress stage based on deep learning in the context of data-deficient. Computers and Electronics in Agriculture, 212:108170, September 2023. [doi]

@article{WangPQSMZLZZHXCZ23,
  title = {Diagnosis of soybean bacterial blight progress stage based on deep learning in the context of data-deficient},
  author = {Xueying Wang and Tong Pan and Jinqiu Qu and Yongzhe Sun and Linxiao Miao and Ziming Zhao 0011 and Yang Li and Zhanguo Zhang and Hongjie Zhao and Zhenbang Hu and Dawei Xin and Qingshan Chen and Rongsheng Zhu},
  year = {2023},
  month = {September},
  doi = {10.1016/j.compag.2023.108170},
  url = {https://doi.org/10.1016/j.compag.2023.108170},
  researchr = {https://researchr.org/publication/WangPQSMZLZZHXCZ23},
  cites = {0},
  citedby = {0},
  journal = {Computers and Electronics in Agriculture},
  volume = {212},
  pages = {108170},
}