Leveraging reliable bits: ECC design considerations for practical secure biometric systems

Yige Wang, Shantanu Rane, Anthony Vetro. Leveraging reliable bits: ECC design considerations for practical secure biometric systems. In First IEEE International Workshop on Information Forensics and Security, WIFS 2009, London, UK, December 6-9, 2009. pages 71-75, IEEE, 2009. [doi]

Authors

Yige Wang

This author has not been identified. Look up 'Yige Wang' in Google

Shantanu Rane

This author has not been identified. Look up 'Shantanu Rane' in Google

Anthony Vetro

This author has not been identified. Look up 'Anthony Vetro' in Google