RF Front-end System Gain and Linearity Built-in Test

Qi Wang, Mani Soma. RF Front-end System Gain and Linearity Built-in Test. In 24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA. pages 228-233, IEEE Computer Society, 2006. [doi]

@inproceedings{WangS06:7,
  title = {RF Front-end System Gain and Linearity Built-in Test},
  author = {Qi Wang and Mani Soma},
  year = {2006},
  doi = {10.1109/VTS.2006.59},
  url = {http://doi.ieeecomputersociety.org/10.1109/VTS.2006.59},
  tags = {testing},
  researchr = {https://researchr.org/publication/WangS06%3A7},
  cites = {0},
  citedby = {0},
  pages = {228-233},
  booktitle = {24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA},
  publisher = {IEEE Computer Society},
  isbn = {0-7695-2514-8},
}