Hsin-Po Wang, Jon Turino. DFT and BIST techniques for the future. In 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan. pages 6-7, IEEE Computer Society, 2000. [doi]
@inproceedings{WangT00:3,
title = {DFT and BIST techniques for the future},
author = {Hsin-Po Wang and Jon Turino},
year = {2000},
url = {http://csdl.computer.org/comp/proceedings/ats/2000/0887/00/08870006abs.htm},
researchr = {https://researchr.org/publication/WangT00%3A3},
cites = {0},
citedby = {0},
pages = {6-7},
booktitle = {9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan},
publisher = {IEEE Computer Society},
isbn = {0-7695-0887-1},
}