Dong Wang, Xiaoyang Tan. Robust Distance Metric Learning in the Presence of Label Noise. In Carla E. Brodley, Peter Stone, editors, Proceedings of the Twenty-Eighth AAAI Conference on Artificial Intelligence, July 27 -31, 2014, Québec City, Québec, Canada. pages 1321-1327, AAAI Press, 2014. [doi]
@inproceedings{WangT14-7,
title = {Robust Distance Metric Learning in the Presence of Label Noise},
author = {Dong Wang and Xiaoyang Tan},
year = {2014},
url = {http://www.aaai.org/ocs/index.php/AAAI/AAAI14/paper/view/8236},
researchr = {https://researchr.org/publication/WangT14-7},
cites = {0},
citedby = {0},
pages = {1321-1327},
booktitle = {Proceedings of the Twenty-Eighth AAAI Conference on Artificial Intelligence, July 27 -31, 2014, Québec City, Québec, Canada},
editor = {Carla E. Brodley and Peter Stone},
publisher = {AAAI Press},
isbn = {978-1-57735-661-5},
}