The following publications are possibly variants of this publication:
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- Single Mixed Sampling Plan Based on Yield Index for Linear ProfilesFu-Kwun Wang, Shih-Che Lo. qre, 32(4):1535-1543, 2016. [doi]
- Two New Independent Mixed Sampling Plans for Inspecting a Product with Linear ProfilesFu-Kwun Wang, Yeneneh Tamirat. qre, 32(8):2999-3009, 2016. [doi]
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