Degradation Study of Thin-Film Silicon Structures in a Cell Culture Medium - researchr publication authors

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Huachun Wang, Jingjing Tian, Bingwei Lu, Yang Xie, Pengcheng Sun, Lan Yin, Yuguang Wang, Xing-sheng. Degradation Study of Thin-Film Silicon Structures in a Cell Culture Medium. Sensors, 22(3):802, 2022. [doi]

This author has not been identified. Look up 'Huachun Wang' in GoogleThis author has not been identified. Look up 'Jingjing Tian' in GoogleThis author has not been identified. Look up 'Bingwei Lu' in GoogleThis author has not been identified. Look up 'Yang Xie' in GoogleThis author has not been identified. Look up 'Pengcheng Sun' in GoogleThis author has not been identified. Look up 'Lan Yin' in GoogleThis author has not been identified. Look up 'Yuguang Wang' in GoogleThis author has not been identified. Look up 'Xing-sheng' in Google

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