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Detect occluded items in X-ray baggage inspection

Bei Wang, Yan Tian, Jialei Wang, Jiayu Hu, Dongsheng Liu, Zhaocheng Xu. Detect occluded items in X-ray baggage inspection. Computers & Graphics, 115:148-157, October 2023. [doi]

Authors

Bei Wang

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Yan Tian

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Jialei Wang

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Jiayu Hu

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Dongsheng Liu

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Zhaocheng Xu

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