Yongli Wang, Jiao Wang, Feng Gao, Panfeng Hu, Li Xu, Jian Zhang, Yiliang Yu, Jun Xue, Jianqing Li. Detection and Recognition for Fault Insulator Based on Deep Learning. In Wei Li, Qingli Li, Lipo Wang, editors, 11th International Congress on Image and Signal Processing, BioMedical Engineering and Informatics, CISP-BMEI 2018, Beijing, China, October 13-15, 2018. pages 1-6, IEEE, 2018. [doi]
@inproceedings{WangWGHXZYXL18,
title = {Detection and Recognition for Fault Insulator Based on Deep Learning},
author = {Yongli Wang and Jiao Wang and Feng Gao and Panfeng Hu and Li Xu and Jian Zhang and Yiliang Yu and Jun Xue and Jianqing Li},
year = {2018},
doi = {10.1109/CISP-BMEI.2018.8633245},
url = {https://doi.org/10.1109/CISP-BMEI.2018.8633245},
researchr = {https://researchr.org/publication/WangWGHXZYXL18},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {11th International Congress on Image and Signal Processing, BioMedical Engineering and Informatics, CISP-BMEI 2018, Beijing, China, October 13-15, 2018},
editor = {Wei Li and Qingli Li and Lipo Wang},
publisher = {IEEE},
isbn = {978-1-5386-7604-2},
}