Gang Wang, Jian Wang, Zi-Chu Qi. A testability-aware low power architecture. In IEEE 25th International SOC Conference, SOCC 2012, Niagara Falls, NY, USA, September 12-14, 2012. pages 184-189, IEEE, 2012. [doi]
@inproceedings{WangWQ12-2,
title = {A testability-aware low power architecture},
author = {Gang Wang and Jian Wang and Zi-Chu Qi},
year = {2012},
doi = {10.1109/SOCC.2012.6398392},
url = {http://dx.doi.org/10.1109/SOCC.2012.6398392},
researchr = {https://researchr.org/publication/WangWQ12-2},
cites = {0},
citedby = {0},
pages = {184-189},
booktitle = {IEEE 25th International SOC Conference, SOCC 2012, Niagara Falls, NY, USA, September 12-14, 2012},
publisher = {IEEE},
isbn = {978-1-4673-1294-3},
}