Dandan Wang, Qing Wang, Ye Yang, Qi Li, Haitao Wang, Feng Yuan. "Is It Really a Defect?" An Empirical Study on Measuring and Improving the Process of Software Defect Reporting. In Proceedings of the 5th International Symposium on Empirical Software Engineering and Measurement, ESEM 2011, Banff, AB, Canada, September 22-23, 2011. pages 434-443, IEEE, 2011. [doi]
@inproceedings{WangWYLWY11,
title = {"Is It Really a Defect?" An Empirical Study on Measuring and Improving the Process of Software Defect Reporting},
author = {Dandan Wang and Qing Wang and Ye Yang and Qi Li and Haitao Wang and Feng Yuan},
year = {2011},
doi = {10.1109/ESEM.2011.62},
url = {http://doi.ieeecomputersociety.org/10.1109/ESEM.2011.62},
researchr = {https://researchr.org/publication/WangWYLWY11},
cites = {0},
citedby = {0},
pages = {434-443},
booktitle = {Proceedings of the 5th International Symposium on Empirical Software Engineering and Measurement, ESEM 2011, Banff, AB, Canada, September 22-23, 2011},
publisher = {IEEE},
isbn = {978-1-4577-2203-5},
}