Fuyi Wang, Yanping Wang, Leo Yu Zhang, Yuval Hertzog, Michael Loewy, Dominique Valladolid, Julio Medeiros, Muna Al-Hawawreh 0001, Robin Doss. WiP: Towards Zero Trust Authentication in Critical Industrial Infrastructures with PRISM. In Jianying Zhou 0001, Lejla Batina, Zengpeng Li, Jingqiang Lin, Eleonora Losiouk, Suryadipta Majumdar, Daisuke Mashima, Weizhi Meng 0001, Stjepan Picek, Mohammad Ashiqur Rahman, Jun Shao, Masaki Shimaoka, Ezekiel O. Soremekun, Chunhua Su, Je Sen Teh, Aleksei Udovenko, Cong Wang 0001, Leo Yu Zhang, Yury Zhauniarovich, editors, Applied Cryptography and Network Security Workshops - ACNS 2023 Satellite Workshops, ADSC, AIBlock, AIHWS, AIoTS, CIMSS, Cloud S&P, SCI, SecMT, SiMLA, Kyoto, Japan, June 19-22, 2023, Proceedings. Volume 13907 of Lecture Notes in Computer Science, pages 336-354, Springer, 2023. [doi]
@inproceedings{WangWZHLVMAD23,
title = {WiP: Towards Zero Trust Authentication in Critical Industrial Infrastructures with PRISM},
author = {Fuyi Wang and Yanping Wang and Leo Yu Zhang and Yuval Hertzog and Michael Loewy and Dominique Valladolid and Julio Medeiros and Muna Al-Hawawreh 0001 and Robin Doss},
year = {2023},
doi = {10.1007/978-3-031-41181-6_19},
url = {https://doi.org/10.1007/978-3-031-41181-6_19},
researchr = {https://researchr.org/publication/WangWZHLVMAD23},
cites = {0},
citedby = {0},
pages = {336-354},
booktitle = {Applied Cryptography and Network Security Workshops - ACNS 2023 Satellite Workshops, ADSC, AIBlock, AIHWS, AIoTS, CIMSS, Cloud S&P, SCI, SecMT, SiMLA, Kyoto, Japan, June 19-22, 2023, Proceedings},
editor = {Jianying Zhou 0001 and Lejla Batina and Zengpeng Li and Jingqiang Lin and Eleonora Losiouk and Suryadipta Majumdar and Daisuke Mashima and Weizhi Meng 0001 and Stjepan Picek and Mohammad Ashiqur Rahman and Jun Shao and Masaki Shimaoka and Ezekiel O. Soremekun and Chunhua Su and Je Sen Teh and Aleksei Udovenko and Cong Wang 0001 and Leo Yu Zhang and Yury Zhauniarovich},
volume = {13907},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-031-41181-6},
}