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Zhihua Wang, Qiong Wu, Xiongjian Zhang, Xinlei Wen, Yongbo Zhang, Chengrui Liu, Huimin Fu. A generalized degradation model based on Gaussian process. Microelectronics Reliability, 85:207-214, 2018. [doi]

This author has not been identified. Look up 'Zhihua Wang' in GoogleThis author has not been identified. Look up 'Qiong Wu' in GoogleThis author has not been identified. Look up 'Xiongjian Zhang' in GoogleThis author has not been identified. Look up 'Xinlei Wen' in GoogleThis author has not been identified. Look up 'Yongbo Zhang' in GoogleThis author has not been identified. Look up 'Chengrui Liu' in GoogleThis author has not been identified. Look up 'Huimin Fu' in Google

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