Expected Patch Log Likelihood Based on Multi-layer Prior Information Learning

Shunfeng Wang, Jiacen Xie, Yuhui Zheng, Tao Jiang, ShuHang Xue. Expected Patch Log Likelihood Based on Multi-layer Prior Information Learning. In James J. Park, Vincenzo Loia, Gangman Yi, Yunsick Sung, editors, Advances in Computer Science and Ubiquitous Computing - CSA/CUTE 2017, Taichung, Taiwan, 18-20 December. Volume 474 of Lecture Notes in Electrical Engineering, pages 299-304, Springer, 2017. [doi]

@inproceedings{WangXZJX17,
  title = {Expected Patch Log Likelihood Based on Multi-layer Prior Information Learning},
  author = {Shunfeng Wang and Jiacen Xie and Yuhui Zheng and Tao Jiang and ShuHang Xue},
  year = {2017},
  doi = {10.1007/978-981-10-7605-3_49},
  url = {https://doi.org/10.1007/978-981-10-7605-3_49},
  researchr = {https://researchr.org/publication/WangXZJX17},
  cites = {0},
  citedby = {0},
  pages = {299-304},
  booktitle = {Advances in Computer Science and Ubiquitous Computing - CSA/CUTE 2017, Taichung, Taiwan, 18-20 December},
  editor = {James J. Park and Vincenzo Loia and Gangman Yi and Yunsick Sung},
  volume = {474},
  series = {Lecture Notes in Electrical Engineering},
  publisher = {Springer},
  isbn = {978-981-10-7605-3},
}