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Discrete Bayesian-Based Scheme of Software Reliability Demonstration Testing with Decreasing Function for the Safety Critical Software

Xuecheng Wang, Risheng Yang, Minyan Lu, Haifeng Li. Discrete Bayesian-Based Scheme of Software Reliability Demonstration Testing with Decreasing Function for the Safety Critical Software. In Muren Liu, Yuping Wang, Ping Guo, editors, 2010 International Conference on Computational Intelligence and Security, CIS 2010, Nanning, Guangxi Zhuang Autonomous Region, China, December 11-14, 2010. pages 591-595, IEEE, 2010. [doi]

Authors

Xuecheng Wang

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Risheng Yang

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Minyan Lu

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Haifeng Li

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