Shujuan Wang, Qiong Yu, Li Ren, Wanbin Ren. Study on Contact Failure Mechanisms of Accelerated Life Test for Relay Reliability. IEICE Transactions, 92-C(8):1034-1039, 2009. [doi]
@article{WangYRR09,
title = {Study on Contact Failure Mechanisms of Accelerated Life Test for Relay Reliability},
author = {Shujuan Wang and Qiong Yu and Li Ren and Wanbin Ren},
year = {2009},
url = {http://search.ieice.org/bin/summary.php?id=e92-c_8_1034},
tags = {testing, reliability},
researchr = {https://researchr.org/publication/WangYRR09},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {92-C},
number = {8},
pages = {1034-1039},
}