Yuanyuan Wang, Jun Yuan, Xiangjun Zeng, Yue Huang. A survey on faulty line selection technology for single-phase-to-ground fault in China. In 2013 IEEE Industry Applications Society Annual Meeting, Lake Buena Vista, FL, USA, October 6-11, 2013. pages 1-5, IEEE, 2013. [doi]
@inproceedings{WangYZH13, title = {A survey on faulty line selection technology for single-phase-to-ground fault in China}, author = {Yuanyuan Wang and Jun Yuan and Xiangjun Zeng and Yue Huang}, year = {2013}, doi = {10.1109/IAS.2013.6682609}, url = {http://dx.doi.org/10.1109/IAS.2013.6682609}, researchr = {https://researchr.org/publication/WangYZH13}, cites = {0}, citedby = {0}, pages = {1-5}, booktitle = {2013 IEEE Industry Applications Society Annual Meeting, Lake Buena Vista, FL, USA, October 6-11, 2013}, publisher = {IEEE}, }