Tao Wang, Kangkang Zhang, Wei Chen, Wensheng Dou, Jiaxin Zhu, Jun Wei 0001, Tao Huang. Understanding device integration bugs in smart home system. In Sukyoung Ryu, Yannis Smaragdakis, editors, ISSTA '22: 31st ACM SIGSOFT International Symposium on Software Testing and Analysis, Virtual Event, South Korea, July 18 - 22, 2022. pages 429-441, ACM, 2022. [doi]
@inproceedings{WangZCDZWH22,
title = {Understanding device integration bugs in smart home system},
author = {Tao Wang and Kangkang Zhang and Wei Chen and Wensheng Dou and Jiaxin Zhu and Jun Wei 0001 and Tao Huang},
year = {2022},
doi = {10.1145/3533767.3534365},
url = {https://doi.org/10.1145/3533767.3534365},
researchr = {https://researchr.org/publication/WangZCDZWH22},
cites = {0},
citedby = {0},
pages = {429-441},
booktitle = {ISSTA '22: 31st ACM SIGSOFT International Symposium on Software Testing and Analysis, Virtual Event, South Korea, July 18 - 22, 2022},
editor = {Sukyoung Ryu and Yannis Smaragdakis},
publisher = {ACM},
isbn = {978-1-4503-9379-9},
}