Test Point Insertion for Multi-Cycle Power-On Self-Test

Senling Wang, Xihong Zhou, Yoshinobu Higami, Hiroshi Takahashi, Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima. Test Point Insertion for Multi-Cycle Power-On Self-Test. ACM Trans. Design Autom. Electr. Syst., 28(3), 2023. [doi]

@article{WangZHTIMM23,
  title = {Test Point Insertion for Multi-Cycle Power-On Self-Test},
  author = {Senling Wang and Xihong Zhou and Yoshinobu Higami and Hiroshi Takahashi and Hiroyuki Iwata and Yoichi Maeda and Jun Matsushima},
  year = {2023},
  doi = {10.1145/3563552},
  url = {https://doi.org/10.1145/3563552},
  researchr = {https://researchr.org/publication/WangZHTIMM23},
  cites = {0},
  citedby = {0},
  journal = {ACM Trans. Design Autom. Electr. Syst.},
  volume = {28},
  number = {3},
}