Luisa Watkins, Sheila W. Seidel, Minxu Peng, Akshay Agarwal, Christopher C. Yu, Vivek K. Goyal. Robustness of Time-Resolved Measurement to Unknown and Variable Beam Current in Particle Beam Microscopy. In 2021 IEEE International Conference on Image Processing, ICIP 2021, Anchorage, AK, USA, September 19-22, 2021. pages 3487-3491, IEEE, 2021. [doi]
@inproceedings{WatkinsSPAYG21,
title = {Robustness of Time-Resolved Measurement to Unknown and Variable Beam Current in Particle Beam Microscopy},
author = {Luisa Watkins and Sheila W. Seidel and Minxu Peng and Akshay Agarwal and Christopher C. Yu and Vivek K. Goyal},
year = {2021},
doi = {10.1109/ICIP42928.2021.9506340},
url = {https://doi.org/10.1109/ICIP42928.2021.9506340},
researchr = {https://researchr.org/publication/WatkinsSPAYG21},
cites = {0},
citedby = {0},
pages = {3487-3491},
booktitle = {2021 IEEE International Conference on Image Processing, ICIP 2021, Anchorage, AK, USA, September 19-22, 2021},
publisher = {IEEE},
isbn = {978-1-6654-4115-5},
}