Incorporation of Hard-Fault-Coverage in Model-Based Testing of Mixed-Signal ICs - researchr publication authors

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Carsten Wegener, Michael Peter Kennedy. Incorporation of Hard-Fault-Coverage in Model-Based Testing of Mixed-Signal ICs. In 2000 Design, Automation and Test in Europe (DATE 2000), 27-30 March 2000, Paris, France. pages 765, IEEE Computer Society, 2000. [doi]

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