Automatically Tagging the "AAA" Pattern in Unit Test Cases Using Machine Learning Models - researchr publication authors

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Chenhao Wei, Lu Xiao 0001, Tingting Yu, Xinyu Chen, Xiao Wang, Sunny Wong, Abigail Clune. Automatically Tagging the "AAA" Pattern in Unit Test Cases Using Machine Learning Models. In 37th IEEE/ACM International Conference on Automated Software Engineering, ASE 2022, Rochester, MI, USA, October 10-14, 2022. ACM, 2022. [doi]

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