Yuan Wei. Use software reliability growth models wisely. In IEEE 24th International Symposium on Software Reliability Engineering, ISSRE 2013, Pasadena, CA, USA, November 4-7, 2013 - Supplemental Proceedings. pages 243-262, IEEE, 2013. [doi]
@inproceedings{Wei13-6,
title = {Use software reliability growth models wisely},
author = {Yuan Wei},
year = {2013},
doi = {10.1109/ISSREW.2013.6688903},
url = {http://dx.doi.org/10.1109/ISSREW.2013.6688903},
researchr = {https://researchr.org/publication/Wei13-6},
cites = {0},
citedby = {0},
pages = {243-262},
booktitle = {IEEE 24th International Symposium on Software Reliability Engineering, ISSRE 2013, Pasadena, CA, USA, November 4-7, 2013 - Supplemental Proceedings},
publisher = {IEEE},
}