Kaixuan Wei, Ying Fu 0001, Yinqiang Zheng, Jiaolong Yang. Physics-Based Noise Modeling for Extreme Low-Light Photography. IEEE Trans. Pattern Anal. Mach. Intell., 44(11):8520-8537, 2022. [doi]
@article{WeiFZY22,
title = {Physics-Based Noise Modeling for Extreme Low-Light Photography},
author = {Kaixuan Wei and Ying Fu 0001 and Yinqiang Zheng and Jiaolong Yang},
year = {2022},
doi = {10.1109/TPAMI.2021.3103114},
url = {https://doi.org/10.1109/TPAMI.2021.3103114},
researchr = {https://researchr.org/publication/WeiFZY22},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Pattern Anal. Mach. Intell.},
volume = {44},
number = {11},
pages = {8520-8537},
}