Positive and Unlabeled Learning for Detecting Software Functional Clones with Adversarial Training

Huihui Wei, Ming Li. Positive and Unlabeled Learning for Detecting Software Functional Clones with Adversarial Training. In Jérôme Lang, editor, Proceedings of the Twenty-Seventh International Joint Conference on Artificial Intelligence, IJCAI 2018, July 13-19, 2018, Stockholm, Sweden. pages 2840-2846, ijcai.org, 2018. [doi]

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